Invention Grant
- Patent Title: Testing head comprising vertical probes
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Application No.: US15703614Application Date: 2017-09-13
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Publication No.: US10551433B2Publication Date: 2020-02-04
- Inventor: Roberto Crippa , Raffaele Vallauri , Emanuele Bertarelli , Daniele Perego
- Applicant: TECHNOPROBE S.p.A.
- Applicant Address: IT Cernusco Lombardone
- Assignee: TECHNOPROBE S.P.A.
- Current Assignee: TECHNOPROBE S.P.A.
- Current Assignee Address: IT Cernusco Lombardone
- Agency: Seed Intellectual Property Law Group LLP
- Priority: ITMI2015A0384 20150313
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/067

Abstract:
A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.
Public/Granted literature
- US20180003767A1 TESTING HEAD COMPRISING VERTICAL PROBES Public/Granted day:2018-01-04
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