Invention Grant
- Patent Title: Spectrometry in integrated circuit using a photonic bandgap structure
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Application No.: US15800009Application Date: 2017-10-31
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Publication No.: US10557754B2Publication Date: 2020-02-11
- Inventor: Benjamin Stassen Cook , Daniel Lee Revier
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Michael A. Davis, Jr.; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L21/00
- IPC: H01L21/00 ; G01J3/02 ; G02B6/122 ; G01N21/3581 ; G01J3/12

Abstract:
An encapsulated package is provided that includes an integrated circuit (IC) die. An encapsulation material encapsulates the IC die. A set of broadband spectral sensors on the IC die are configured to generate a set of signals in response to electromagnetic energy received by the spectral sensors. A photonic filter structure within the encapsulation material is positioned adjacent the set of spectral sensors. The photonic filter structure is configured to pass a different frequency band of electromagnetic energy to each of the set of spectral sensors.
Public/Granted literature
- US20190128735A1 Spectrometry in Integrated Circuit Using a Photonic Bandgap Structure Public/Granted day:2019-05-02
Information query
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