Invention Grant
- Patent Title: High throughput methods of analyzing seed cotton using X-ray imaging
-
Application No.: US15511875Application Date: 2015-09-25
-
Publication No.: US10557805B2Publication Date: 2020-02-11
- Inventor: Govind Chaudhary , Anju Gupta , Kolbyn S. Joy , John J. Kotyk , Randall K. Rader , Richard H. Sheetz , Brad D. White
- Applicant: Monsanto Technology LLC
- Applicant Address: US MO St. Louis
- Assignee: MONSANTO TECHNOLOGY LLC
- Current Assignee: MONSANTO TECHNOLOGY LLC
- Current Assignee Address: US MO St. Louis
- Agency: Sandberg Phoenix & von Gontard PC
- International Application: PCT/US2015/052133 WO 20150925
- International Announcement: WO2016/049408 WO 20160331
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/00 ; G01N23/046 ; G01N33/00 ; G01N23/10

Abstract:
A system for analyzing intact cotton, wherein the system comprises an X-ray scanner system and a plurality of sample containers, wherein at least one seed cotton sample container is structured and operable to retain a respective one of a plurality of intact cotton samples. The system additionally comprises a sample support platform that is structured and operable to move the plurality of sample containers past an image data generation assembly of the X-ray scanner system. The system further comprises a computer based system that is structured and operable to execute image analysis software to determine at least one metric of at least one of the intact cotton samples.
Public/Granted literature
- US20180217072A1 HIGH THROUGHPUT METHODS OF ANALYZING SEED COTTON USING X-RAY IMAGING Public/Granted day:2018-08-02
Information query