Invention Grant
- Patent Title: Methods and systems for testing components of parallel computing devices
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Application No.: US15719102Application Date: 2017-09-28
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Publication No.: US10558539B2Publication Date: 2020-02-11
- Inventor: Shige Wang , Gurmitsingh M. Banvait , Sidharth Nakra , Shane M. Boehner , Joseph G. D Ambrosio
- Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Applicant Address: US MI Detroit
- Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee Address: US MI Detroit
- Agency: Lorenz & Kopf, LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/26 ; G06F11/07

Abstract:
Systems and methods are provided for testing a first computer device of a vehicle. A method includes selecting an operational component of the first computer device and selecting a test operation that is configured to utilize an entire capacity of the operational component. The method further includes instructing the first computer device to perform the test operation and to generate a first result. The method further yet includes retrieving a second result of the test operation and comparing the first result of the test operation from the first computer device with the second result. The method further yet includes indicating that the first computer device is faulty based at least in part on a difference between the first result and the second result.
Public/Granted literature
- US20190095302A1 METHODS AND SYSTEMS FOR TESTING COMPONENTS OF PARALLEL COMPUTING DEVICES Public/Granted day:2019-03-28
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