Invention Grant
- Patent Title: Detector for surface measuring device
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Application No.: US16535936Application Date: 2019-08-08
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Publication No.: US10571238B2Publication Date: 2020-02-25
- Inventor: Hideki Morii
- Applicant: Tokyo Seimitsu Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2017-033572 20170224
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B5/20

Abstract:
The detector for a surface measuring device includes: an arm including a contact at a tip end of the arm; a rotation shaft configured to rotatably support the arm; a transmission part having one end connected to the arm at a position on a side opposite to the contact with respect to the rotation shaft; an elastic part having one end connected to another end of the transmission part and configured to generate a measuring force to be applied to the contact; a position adjusting part connected to another end of the elastic part and configured to move a position of the another end of the elastic part in a moving direction; and a tilt adjusting part connected to the arm and including a contact part arranged at position where the contact part can be brought into contact with the transmission part.
Public/Granted literature
- US20190360793A1 DETECTOR FOR SURFACE MEASURING DEVICE Public/Granted day:2019-11-28
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