Invention Grant
- Patent Title: Method for manufacturing detection coil for magnetic resonance measurement
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Application No.: US15654049Application Date: 2017-07-19
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Publication No.: US10571533B2Publication Date: 2020-02-25
- Inventor: Shigetoshi Oshima , Shigenori Tsuji
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2016-142061 20160720
- Main IPC: H01L39/24
- IPC: H01L39/24 ; G01R33/34 ; H01L39/12

Abstract:
A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
Public/Granted literature
- US10539634B2 Method for manufacturing detection coil for magnetic resonance measurement Public/Granted day:2020-01-21
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