Invention Grant
- Patent Title: Fault detection method and device
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Application No.: US16153201Application Date: 2018-10-05
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Publication No.: US10575074B2Publication Date: 2020-02-25
- Inventor: Jian Yin , Wei Wang , Peng Li , Fuxue Liu
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Main IPC: H04J14/08
- IPC: H04J14/08 ; H04Q11/00 ; H04J3/14 ; H04J3/16 ; H04L1/00 ; H04B10/079

Abstract:
A fault detection method and device is disclosed. The method includes obtaining, by an optical transport network (OTN) device, a first OTN frame. The first OTN frame includes a plurality of payload areas. Each payload area includes payload check information and payload data. The method further includes performing fault detection, according to the payload check information, of payload data of a payload area in which the payload check information is located. The first OTN frame is divided into a plurality of payload areas, and corresponding payload check information is carried in each payload area.
Public/Granted literature
- US20190045282A1 FAULT DETECTION METHOD AND DEVICE Public/Granted day:2019-02-07
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