Invention Grant
- Patent Title: Inner-wall measuring instrument and offset-amount calculation method
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Application No.: US15439120Application Date: 2017-02-22
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Publication No.: US10578414B2Publication Date: 2020-03-03
- Inventor: Yasuhiro Takahama
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2016-034776 20160225
- Main IPC: G01B3/22
- IPC: G01B3/22 ; G01B5/06 ; G01B5/12 ; G01B5/00 ; G01B11/06 ; G01B11/24 ; G01B11/12 ; G01N21/954 ; G01B11/14 ; G01M15/04

Abstract:
An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.
Public/Granted literature
- US20170248399A1 INNER-WALL MEASURING INSTRUMENT AND OFFSET-AMOUNT CALCULATION METHOD Public/Granted day:2017-08-31
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