Invention Grant
- Patent Title: Object measurement apparatus and object measurement method
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Application No.: US15967791Application Date: 2018-05-01
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Publication No.: US10578426B2Publication Date: 2020-03-03
- Inventor: Tomonori Masuda
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2015-231878 20151127
- Main IPC: G01B11/08
- IPC: G01B11/08 ; G06T7/62 ; G06T7/521 ; G01B11/26 ; G01C3/08 ; G01B11/14 ; G01B11/02 ; G01C11/00

Abstract:
A first angle α formed between a direction normal to a white board (100) that is disposed along a plurality of reinforcing bars (2) and an imaging direction of a camera (200) and a second angle β indicating the direction of the reinforcing bar 2 which is a measurement target with respect to the imaging direction of the camera (200) are detected. In addition, a first distance D1 between the camera (200) and the white board (100) is measured by a laser distance meter provided in the camera (200). The amount of deviation D2 of the reinforcing bar (2) in the imaging direction of the camera (200) with respect to the first distance D1 is calculated on the basis of the measured first distance D1, the detected first angle α, and the detected second angle β.
Public/Granted literature
- US20180245909A1 OBJECT MEASUREMENT APPARATUS AND OBJECT MEASUREMENT METHOD Public/Granted day:2018-08-30
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