Invention Grant
- Patent Title: Spectroscopic instrument
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Application No.: US15284886Application Date: 2016-10-04
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Publication No.: US10578485B2Publication Date: 2020-03-03
- Inventor: Taichi Yuasa
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2015-199194 20151007
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/02 ; G02B27/00 ; G02B5/10 ; G02B13/18 ; G01J3/10 ; G01J3/42 ; G01N21/27 ; G01N33/38

Abstract:
The invention provides a spectroscopic instrument, which comprises a projecting optical system for projecting a projecting light emitted from a light source, a photodetecting optical system for receiving a reflection light from an object to be measured and for guiding to a photodetection member, and a spectroscope for detecting a condition of the object to be measured based on the reflection light as received by the photodetection member, wherein the projecting optical system and the photodetecting optical system have a projecting system chromatic aberration decreasing component and a photodetecting system chromatic aberration decreasing component which eliminate chromatic aberrations, respectively.
Public/Granted literature
- US20170102265A1 Spectroscopic Instrument Public/Granted day:2017-04-13
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