- 专利标题: Stage device and charged particle beam device
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申请号: US16122189申请日: 2018-09-05
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公开(公告)号: US10600614B2公开(公告)日: 2020-03-24
- 发明人: Motohiro Takahashi , Masaki Mizuochi , Shuichi Nakagawa , Tomotaka Shibazaki , Hironori Ogawa , Naruo Watanabe , Takanori Kato
- 申请人: Hitachi High-Technologies Corporation
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2017-189403 20170929; JP2018-086043 20180427
- 主分类号: H01J37/20
- IPC分类号: H01J37/20 ; H01J37/26 ; H01J37/22
摘要:
The present invention is to provide a stage device capable of improving field-of-view positioning accuracy of a stage having a Z-axis mechanism. The invention is directed to a sample stage device having a first table that moves a sample in a first direction, a second driving mechanism that moves the first table in a second direction different from the first direction, and a part having a function of moving a laser interferometer optical axis that measures the position of the first table, in the second direction.
公开/授权文献
- US20190103246A1 STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE 公开/授权日:2019-04-04
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