Invention Grant
- Patent Title: Sensor subsystems for non-contact voltage measurement devices
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Application No.: US15695998Application Date: 2017-09-05
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Publication No.: US10605832B2Publication Date: 2020-03-31
- Inventor: David L. Epperson , Ronald Steuer , Jeffrey Worones , Patrick Scott Hunter , Ricardo Rodriguez
- Applicant: Fluke Corporation
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Seed Intellectual Property Law Group LLP
- Main IPC: G01R15/16
- IPC: G01R15/16 ; G01R19/28 ; G01R19/165 ; G01R15/20 ; G01R1/22 ; G01R15/14 ; G01R19/00

Abstract:
Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.
Public/Granted literature
- US20180136259A1 SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES Public/Granted day:2018-05-17
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