Sensor probe with clamp having adjustable interior region for non-contact electrical measurement

    公开(公告)号:US11513140B2

    公开(公告)日:2022-11-29

    申请号:US17169113

    申请日:2021-02-05

    申请人: Fluke Corporation

    IPC分类号: G01R15/18 G01R19/00

    摘要: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.

    Non-contact DC voltage measurement device with oscillating sensor

    公开(公告)号:US11209480B2

    公开(公告)日:2021-12-28

    申请号:US17018931

    申请日:2020-09-11

    申请人: Fluke Corporation

    IPC分类号: G01R31/302 G01R31/28

    摘要: Systems and methods for measuring DC voltage of an insulated conductor (e.g., insulated wire) are provided, without requiring a galvanic connection between the conductor and a test electrode or probe. A non-contact DC voltage measurement device may include a conductive sensor that is mechanically oscillated. The device may also include a conductive internal ground guard that is galvanically isolated from the conductive sensor, and a conductive reference shield that is galvanically insulated from the internal ground guard. The device may further include a common mode reference voltage source that generates an alternating current (AC) reference voltage, and a sensor signal measurement subsystem electrically coupled to the conductive sensor. Control circuitry may receive a sensor current signal from the sensor signal measurement subsystem, and determine the DC voltage in the insulated conductor based at least in part on the received sensor current signal.

    SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES

    公开(公告)号:US20180136259A1

    公开(公告)日:2018-05-17

    申请号:US15695998

    申请日:2017-09-05

    申请人: Fluke Corporation

    摘要: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuity of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.

    SENSOR PROBE WITH CLAMP HAVING ADJUSTABLE INTERIOR REGION FOR NON-CONTACT ELECTRICAL MEASUREMENT

    公开(公告)号:US20210239741A1

    公开(公告)日:2021-08-05

    申请号:US17169113

    申请日:2021-02-05

    申请人: Fluke Corporation

    IPC分类号: G01R15/18 G01R19/00

    摘要: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.

    Magnetically coupled ground reference probe

    公开(公告)号:US09933459B1

    公开(公告)日:2018-04-03

    申请号:US15400152

    申请日:2017-01-06

    申请人: Fluke Corporation

    IPC分类号: G01R1/06 G01R15/12

    摘要: Systems and methods of providing a magnetically coupled ground reference probe for use with test equipment, such as digital multimeters (DMMs). The magnetically coupled ground reference probes disclosed herein may be used instead of a typical test probe or alligator clip. A magnetically coupled ground reference probe may be provided which includes an insulative housing surrounding a conductive magnet such as a permanent magnet or an electromagnet. The magnet may autonomously retract into a cavity of the insulative housing when not coupled to a ground reference so that the magnet does not contact a high potential source when being handled by the operator. In at least some implementations, at least a portion of the insulation material of the housing may be compressible to allow the magnet to come into physical contact with a ground reference surface while providing a sufficient creepage and clearance path.

    Fluorescent lamp testing device
    7.
    发明授权

    公开(公告)号:US09651606B2

    公开(公告)日:2017-05-16

    申请号:US14306094

    申请日:2014-06-16

    申请人: Fluke Corporation

    IPC分类号: G01R31/24 G01R31/44

    CPC分类号: G01R31/245 G01R31/44

    摘要: A fluorescent lamp testing device 10 has a microcontroller 100 that controls tests for ballast discrimination as well as gas integrity, ballast operation, filament continuity and line voltage. The ballast discrimination test is performed by the microcontroller 100 in combination with a photodiode 30 and high/low pass filter 32. Gas integrity is tested with pulse width modulation and a high-voltage, step-up transformer (PWM/T) circuit 42 and an antenna 40. A built in continuity tester has input pins 52, 54 to test the continuity of the filaments in the fluorescent lamp 12. The antenna 40 and a voltage-divider/voltage-sensor connected to the secondary coil in the transformer test for ballast operation. A PCB conductive loop 18, rectifier 20 and op amp 22 test for line voltage.

    Adjustable length Rogowski coil measurement device with non-contact voltage measurement

    公开(公告)号:US10746767B2

    公开(公告)日:2020-08-18

    申请号:US15975187

    申请日:2018-05-09

    申请人: Fluke Corporation

    摘要: Systems and methods are provided for measuring electrical parameters in an insulated conductor without requiring a galvanic connection. A non-contact, electrical parameter sensor probe may be operative to measure both current and voltage in an insulated conductor. The sensor probe includes a body, a Rogowski coil coupled to the body, and a non-contact voltage sensor coupled to the body or the Rogowski coil. The size of the loop of the Rogowski coil is selectively adjustable, such that the loop may be tightened around the conductor under test until the conductor is positioned adjacent a portion of the body or Rogowski coil that includes the non-contact voltage sensor. Measured electrical parameters may be provided to a user, e.g., via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.

    Sensor subsystems for non-contact voltage measurement devices

    公开(公告)号:US10605832B2

    公开(公告)日:2020-03-31

    申请号:US15695998

    申请日:2017-09-05

    申请人: Fluke Corporation

    摘要: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.

    Proving unit for non-contact voltage measurement systems

    公开(公告)号:US10359494B2

    公开(公告)日:2019-07-23

    申请号:US15439473

    申请日:2017-02-22

    申请人: Fluke Corporation

    摘要: Systems and methods provide a portable, verified voltage source that allows safe testing of separate non-contact voltage measurement systems. A proving unit of the present disclosure provides a known or specified alternating current (AC) voltage output across an insulated wire, which AC voltage may be fixed or may be user-selectable through a suitable user interface. The proving unit may include a visual indicator and/or an audible indicator that provides the user with an indication confirming that the proving unit is supplying an output voltage with the specifications of the proving unit, so the user will know that the proving unit is operating normally and is ready for testing a non-contact voltage measurement system. If the proving unit cannot provide the specified voltage output, the indicator(s) provides a signal to the user that the proving unit is currently non-functional.