- Patent Title: Method for manufacturing of display device using inspection pattern
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Application No.: US15973302Application Date: 2018-05-07
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Publication No.: US10608209B2Publication Date: 2020-03-31
- Inventor: Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2017-0118868 20170915
- Main IPC: H01L51/56
- IPC: H01L51/56 ; H01L51/00 ; H01L23/544 ; H01L27/32 ; H01L51/52 ; H01L21/67 ; H01L21/66 ; G09G3/00

Abstract:
A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
Public/Granted literature
- US20190088909A1 METHOD FOR MANUFACTURING OF DISPLAY DEVICE Public/Granted day:2019-03-21
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