Invention Grant
- Patent Title: Method for calibrating an X-ray image
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Application No.: US15781353Application Date: 2016-12-14
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Publication No.: US10653384B2Publication Date: 2020-05-19
- Inventor: Ciamak Abkai
- Applicant: DENTSPLY SIRONA inc.
- Applicant Address: US PA York
- Assignee: DENTSPLY SIRONA INC.
- Current Assignee: DENTSPLY SIRONA INC.
- Current Assignee Address: US PA York
- Agency: Dentsply Sirona Inc.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5c304398
- International Application: PCT/EP2016/080882 WO 20161214
- International Announcement: WO2017/102782 WO 20170622
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B6/00 ; G06T11/00 ; A61B5/00 ; A61B6/02 ; A61B6/14 ; A61C9/00

Abstract:
Disclosed is a method for calibrating at least one 2D X-ray image of an object to be imaged, which is recorded by an X-ray device in that X-rays produced by an X-ray source radiate through the object and are recorded by an X-ray detector. An already existing 3D model of a structure of the object is compared to the 2D X-ray image, wherein an actual image positional relationship of the X-ray source and the X-ray detector relative to the object, and/or relative to one another, is determined for the 2D X-ray image.
Public/Granted literature
- US20180360411A1 METHOD FOR CALIBRATING AN X-RAY IMAGE Public/Granted day:2018-12-20
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