- 专利标题: Self testing fault circuit apparatus and method
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申请号: US15650369申请日: 2017-07-14
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公开(公告)号: US10656199B2公开(公告)日: 2020-05-19
- 发明人: Michael Ostrovsky , Adam Kevelos
- 申请人: Leviton Manufacturing Company
- 申请人地址: US NY Melville
- 专利权人: Leviton Manufacturing Company, Inc.
- 当前专利权人: Leviton Manufacturing Company, Inc.
- 当前专利权人地址: US NY Melville
- 代理机构: Foley & Lardner LLP
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; H02H3/33 ; G01R31/327
摘要:
A process for self testing a fault circuit includes disabling an actuator, performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity, and determining whether the self test was successful.
公开/授权文献
- US20170322254A1 SELF TESTING FAULT CIRCUIT APPARATUS AND METHOD 公开/授权日:2017-11-09
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