Invention Grant
- Patent Title: Cesium primary ion source for secondary ion mass spectrometer
-
Application No.: US15948028Application Date: 2018-04-09
-
Publication No.: US10672602B2Publication Date: 2020-06-02
- Inventor: Peter Williams , Karen Amanda Williams , Maitrayee Bose , John Prince
- Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
- Applicant Address: US AZ Scottsdale
- Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
- Current Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
- Current Assignee Address: US AZ Scottsdale
- Agency: Withrow & Terranova, P.L.L.C.
- Agent Vincent K. Gustafson
- Main IPC: H01J49/14
- IPC: H01J49/14 ; H01J49/26 ; H01J27/26

Abstract:
A primary ion source subassembly for use with a secondary ion mass spectrometer may include a unitary graphite ionizer tube and reservoir base. A primary ion source may include a capillary insert defining an ionizer aperture. An ionizer aperture may be centrally arranged in an outwardly protruding conical or frustoconical surface, and may be overlaid with a refractory metal coating or sheath. Parameters including ionizer surface shape, ionizer materials, ionizer temperature, and beam stop plate orifice geometry may be manipulated to eliminate ghost images. A graphite tube gasket with a dual tapered surface, or an externally threaded graphite tubular connecting body, may promote sealing of a source material cavity.
Public/Granted literature
- US20180240663A1 CESIUM PRIMARY ION SOURCE FOR SECONDARY ION MASS SPECTROMETER Public/Granted day:2018-08-23
Information query