Systems, methods and apparatuses are provided for enhanced surface condition detection based on image scene and ambient light analysis
Abstract:
Systems, Methods and Apparatuses are provided for detecting surface conditions, which includes: an image scene captured by a camera wherein the image scene includes: a set of a plurality of regions of interest (ROIs); and a processor configured to receive the image scene to: extract at least a first and a second ROI from the set of the plurality of ROIs of the image scene; associate the first ROI with an above-horizon region and associate the second ROI with a surface region; analyze the first ROI and the second ROI in parallel for a condition related to an ambient lighting in the first ROI and for an effect related to the ambient lighting in the second ROI; and extract from the first ROI features of the condition of the ambient lighting and extract from the second ROI features of the effect of the ambient lighting on a surface region.
Information query
Patent Agency Ranking
0/0