Invention Grant
- Patent Title: Connected device-triggered failure analysis
-
Application No.: US16412214Application Date: 2019-05-14
-
Publication No.: US10685397B2Publication Date: 2020-06-16
- Inventor: John Jong-Suk Lee , Paul Mon-Wah Chan , Jonathan K. Barnett , Roisin Lara Fritz , Michael Grouios , Joe Moghaizel
- Applicant: The Toronto-Dominion Bank
- Applicant Address: CA Toronto
- Assignee: The Toronto-Dominion Bank
- Current Assignee: The Toronto-Dominion Bank
- Current Assignee Address: CA Toronto
- Agency: Fish & Richardson P.C.
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06Q40/02 ; G06F11/07 ; G06Q10/06 ; G06Q10/00 ; G06F11/00 ; G06F11/34

Abstract:
The present disclosure involves systems and computer implemented methods for performing a failure analysis on a device monitored by at least one connected device, where in response to a determination of an impending failure, at least one corrective action is determined and suggested to the user of the monitored device. In one example, operations include monitoring operations of at least one monitored device using at least one connected device, determining a projected life span of the at least one monitored device based on the monitored operations, and, if the projected life span of the monitored device is less than a threshold amount, determining a corrective action to perform. A proposal can be generated for presentation based on the corrective action. The proposal may be based on the estimated cost of the determined corrective action and an analysis of an account.
Public/Granted literature
- US20190266669A1 Connected Device-Triggered Failure Analysis Public/Granted day:2019-08-29
Information query