Invention Grant
- Patent Title: Laser scanning microscope apparatus
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Application No.: US15132053Application Date: 2016-04-18
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Publication No.: US10690897B2Publication Date: 2020-06-23
- Inventor: Koji Makara , Yoichi Otsuka , Masafumi Kyogaku , Hiroyuki Hashimoto
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A. Inc., IP Division
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7d8f1ab8 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@31e0d594
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G01N21/65 ; G01N21/64

Abstract:
A laser scanning microscope apparatus includes an irradiation unit including an objective lens, a photodetector unit, an XY-scanning unit, and a Z-scanning unit. The irradiation unit focuses a laser beam with the objective lens to a specimen. The photodetector unit detects light generated from a position irradiated with the laser beam focused. The XY-scanning unit scans the laser beam in an X-direction perpendicular to an optical axis of the objective lens and in a Y-direction perpendicular to the optical axis and the X-direction. The Z-scanning unit scans the laser beam in a Z-direction parallel to the optical axis. When acquiring XY-two-dimensional image data by detecting the light while scanning the irradiated position in the X-direction and the Y-direction, the apparatus detects the light while scanning the irradiated position also in the Z-direction.
Public/Granted literature
- US20160306152A1 LASER SCANNING MICROSCOPE APPARATUS Public/Granted day:2016-10-20
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