Invention Grant
- Patent Title: Method for controlling shape measuring apparatus
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Application No.: US15873178Application Date: 2018-01-17
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Publication No.: US10697748B2Publication Date: 2020-06-30
- Inventor: Takashi Noda
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7615a682
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B5/016 ; G01B5/012 ; G01B5/20 ; G01B21/04

Abstract:
A shape measuring apparatus includes a probe head that changes its posture by rotational motion of a first drive axis and a second drive axis, and a coordinate measuring machine that three-dimensionally displaces a location of the probe head by three translation axes (a third drive axis, a fourth drive axis, and a fifth drive axis). The location of a measurement tip is given by coordinate values of the third to fifth drive axes, and the posture of a probe head is given by a first rotating angle α and a second rotating angle β. An intersection point between a first rotation axis and a second rotation axis is set as a rotation center Q. An interpolation point in each control period is calculated for each of the first to fifth drive axes.
Public/Granted literature
- US20180216924A1 METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS Public/Granted day:2018-08-02
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