Invention Grant
- Patent Title: Multi-wavelength laser inspection
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Application No.: US15991292Application Date: 2018-05-29
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Publication No.: US10705019B2Publication Date: 2020-07-07
- Inventor: Keith D. Humfeld , Morteza Safai
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01J3/44 ; G01J3/02 ; H01S5/10 ; G01J3/06 ; G01J3/28

Abstract:
An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.
Public/Granted literature
- US20190369023A1 Multi-wavelength Laser Inspection Public/Granted day:2019-12-05
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