- 专利标题: Sample handling apparatus for pressurized fluids and X-ray analyzer applications thereof
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申请号: US16085306申请日: 2017-03-13
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公开(公告)号: US10705033B2公开(公告)日: 2020-07-07
- 发明人: Joseph J Spinazola, III , Jay Burdett , Zewu Chen , Daniel Dunham
- 申请人: X-RAY OPTICAL SYSTEMS, INC.
- 申请人地址: US NY East Greenbush
- 专利权人: X-RAY OPTICAL SYSTEMS, INC.
- 当前专利权人: X-RAY OPTICAL SYSTEMS, INC.
- 当前专利权人地址: US NY East Greenbush
- 代理机构: Heslin Rothenberg Farley & Mesiti P.C.
- 代理商 Kevin P. Radigan, Esq.
- 国际申请: PCT/US2017/022077 WO 20170313
- 国际公布: WO2017/160705 WO 20170921
- 主分类号: G01N23/2204
- IPC分类号: G01N23/2204 ; G01N23/20041 ; G01N23/223
摘要:
A sample handling apparatus/technique/method for a material analyze including a sample carrier for presenting a pressurized sample (e.g., LPG) to a sample focal area of the analyzer; a removable fixture for charging the pressurized sample into the sample carrier; the removable fixture including at least one port to provide sample to and from the fixture and carrier. The sample handling apparatus may include a retainer, wherein the sample carrier is removeably combined with the fixture using the retainer, the apparatus being insertable into the analyzer for sample analysis; and wherein the retainer includes an aperture for presenting the sample to the focal area from a filmed, lower end of the carrier in proximity therewith.
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