公开(公告)号：US20140294157A1

公开(公告)日：2014-10-02

申请号：US14128078

申请日：2012-10-25

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  Rory D. Delaney ,  John H. Burdett ,  Kai Xin

IPC分类号： G21K1/06

CPC分类号： G21K1/06 ,  G01N23/2076 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/308 ,  G01N2223/315 ,  G21K2201/064

摘要： A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

摘要翻译： 具有多个高度对准的弯曲X射线光学器件的支撑结构，所述支撑结构具有多个内部部分或完全同心的表面，所述光学元件安装在所述多个内部部分或完全同心的表面上，从而使所述光学元件沿着其中心光轴对准，因此与源， /或检测器结合使用该支撑结构。 表面可以嵌套在中心光轴周围; 并且支撑结构可以通过壁纵向分割成围绕中心光轴的部分。 X射线光学元件中的至少一个包括弯曲衍射光学元件，用于接收发散的X射线束并将光束聚焦到焦点区域，在一个实施例中是聚焦单色光学元件。 在改进的实施例中，光学元件包括单层，塑性变形的LiF光学器件。

公开(公告)号：US10705033B2

公开(公告)日：2020-07-07

申请号：US16085306

申请日：2017-03-13

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Joseph J Spinazola, III ,  Jay Burdett ,  Zewu Chen ,  Daniel Dunham

IPC分类号： G01N23/2204 ,  G01N23/20041 ,  G01N23/223

摘要： A sample handling apparatus/technique/method for a material analyze including a sample carrier for presenting a pressurized sample (e.g., LPG) to a sample focal area of the analyzer; a removable fixture for charging the pressurized sample into the sample carrier; the removable fixture including at least one port to provide sample to and from the fixture and carrier. The sample handling apparatus may include a retainer, wherein the sample carrier is removeably combined with the fixture using the retainer, the apparatus being insertable into the analyzer for sample analysis; and wherein the retainer includes an aperture for presenting the sample to the focal area from a filmed, lower end of the carrier in proximity therewith.

公开(公告)号：US10317350B2

公开(公告)日：2019-06-11

申请号：US15314620

申请日：2015-05-29

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  George Allen ,  Andrew Hider ,  Danhong Li ,  Jon Dunphy ,  Joseph Spinazola

IPC分类号： G01N23/223 ,  G01N33/18

摘要： A sample handling apparatus/technique/method for a material analyzer, which provides active, variable concentration of a sample, using a measurement marker introduced into the sample, to measurably concentrate an analyte in a liquid (e.g., water) sample. Active, variable concentration allows otherwise lower level analytes to be concentrated in a measurable way. This enables measurements at higher (e.g., concentrated) levels, which can be extrapolated to obtain their lower, original levels based on the concentration level—measured using the introduced marker as a guide. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, usable during both during the concentration and analyte measurement.

公开(公告)号：US09360440B2

公开(公告)日：2016-06-07

申请号：US14208215

申请日：2014-03-13

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： George Allen ,  John H. Burdett, Jr. ,  Zewu Chen ,  Leslie Johnson

IPC分类号： G01N23/223 ,  B01L3/00 ,  G01N23/22 ,  G01N35/08 ,  G01N1/28 ,  G01N1/00 ,  G01N21/85

CPC分类号： G01N23/223 ,  B01L3/561 ,  G01N1/28 ,  G01N21/85 ,  G01N23/2204 ,  G01N35/085 ,  G01N2001/002 ,  G01N2223/076 ,  G01N2223/637 ,  G01N2223/652

摘要： A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.

摘要翻译： 提供了一种用于材料分析仪的样品处理装置/技术/方法，包括：用于将样品携带到分析仪的样品焦点区域和从样品聚焦区域进行的样品池插入物; 用于将样品提供给细胞插入物的可移除样品携带装置; 以及将样品从携带装置流动到样品池插入件的致动器。 可移除的样品携带装置可以是注射器，并且致动器推动注射器的柱塞以将样品排出到样品池插入件。 样品池插入物可以安装在样品池上，样品池可插入分析器中用于样品分析。 样品处理装置可以与具有光学功能的X射线分析仪组合使用，该X射线分析仪包括具有x射线激发路径和x射线检测路径的x射线引擎，其中x射线 激发和/或x射线检测路径限定样本焦点区域。

公开(公告)号：US10256002B2

公开(公告)日：2019-04-09

申请号：US15334886

申请日：2016-10-26

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  Rory D. Delaney ,  John H. Burdett ,  Kai Xin

IPC分类号： G21K1/06 ,  G01N23/207 ,  G01N23/223

摘要： A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

公开(公告)号：US09449780B2

公开(公告)日：2016-09-20

申请号：US14381023

申请日：2013-02-27

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen

IPC分类号： G21K1/06 ,  H01J35/08 ,  G01N23/223 ,  H01J35/14

CPC分类号： H01J35/08 ,  G01N23/223 ,  G21K1/062 ,  G21K1/067 ,  G21K2201/062 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/084 ,  H01J2235/088

摘要： An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.

摘要翻译： X射线管包括靶，电子撞击在靶上以形成发散的X射线束。 目标具有由第一和第二目标材料形成的表面，每个被定制以发射相应的x射线能量分布。 可以提供第一x射线光学器件用于将光束引导到样品点，第一x射线光学器件使发散的X射线束从第一靶材料发射的能量单色为第一能量; 并且可以提供第二x射线光学器件，用于将光束引导到样品点，第二x射线光学器件将发散的X射线束单色为由第二靶材料发射的能量的第二能量。 使用由第一和第二单色能量诱导的样品点的荧光来测量样品中至少一种元素的浓度，或单独测量涂层和下面的底物中的元素。

公开(公告)号：US20150043713A1

公开(公告)日：2015-02-12

申请号：US14381023

申请日：2013-02-27

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen

IPC分类号： H01J35/08 ,  G21K1/06 ,  G01N23/223 ,  H01J35/14

CPC分类号： H01J35/08 ,  G01N23/223 ,  G21K1/062 ,  G21K1/067 ,  G21K2201/062 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/084 ,  H01J2235/088

摘要： An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.

摘要翻译： X射线管包括靶，电子撞击在靶上以形成发散的X射线束。 目标具有由第一和第二目标材料形成的表面，每个被定制以发射相应的x射线能量分布。 可以提供第一x射线光学器件用于将光束引导到样品点，第一x射线光学器件使发散的X射线束从第一靶材料发射的能量单色为第一能量; 并且可以提供第二x射线光学器件，用于将光束引导到样品点，第二x射线光学器件将发散的X射线束单色为由第二靶材料发射的能量的第二能量。 使用由第一和第二单色能量诱导的样品点的荧光来测量样品中至少一种元素的浓度，或单独测量涂层和下面的底物中的元素。

公开(公告)号：US20140198898A1

公开(公告)日：2014-07-17

申请号：US14127646

申请日：2012-06-14

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Albertus Beumer ,  Zewu Chen

IPC分类号： G01N23/223

CPC分类号： G01N23/223 ,  G01N33/2823 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/637 ,  G01N2223/652

摘要： A technique, including associated method and system, for on-line measurement of a trace element in a crude or heavy fuel stream for a refinery, including in one embodiment: providing at least one x-ray fluorescence (“XRF”) analyzer at a point for the refinery; analyzing the petroleum stream for chlorine using the analyzer; and providing results from the analyzer to refinery operators, to improve refinery operations. The analyzer may be a monochromatic wavelength XRF analyzer, wherein the analyzer focuses energy to/from the stream using an x-ray engine having at least one focusing, monochromating x-ray optic. The analyzer may be an MWDXRF or ME-EDXRF analyzer; and the trace element may be one or more of the following elements: S, Cl, P, K, Ca, V, Mn, Fe, Co, Ni, Cu, Zn, Hg, As, Pb, and Se; and in one embodiment the stream is crude, and the trace element is chlorine.

摘要翻译： 一种技术，包括相关的方法和系统，用于在线测量用于炼油厂的粗油或重燃料流中的微量元素，包括在一个实施方案中：在一个实施方案中提供至少一个X射线荧光（“XRF”）分析仪 炼油厂点; 使用分析仪分析氯气石油流; 并将分析仪的结果提供给炼油厂经营者，以改善炼油厂的运营。 分析仪可以是单色波长XRF分析仪，其中分析仪使用具有至少一个聚焦单色x射线光学器件的x射线引擎将能量聚焦到流/从流中。 分析仪可以是MWDXRF或ME-EDXRF分析仪; 微量元素可以是以下元素中的一种或多种：S，Cl，P，K，Ca，V，Mn，Fe，Co，Ni，Cu，Zn，Hg，As，Pb和Se; 并且在一个实施方案中，流是粗的，并且微量元素是氯。

公开(公告)号：US09343193B2

公开(公告)日：2016-05-17

申请号：US14727027

申请日：2015-06-01

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  David M. Gibson ,  Walter M. Gibson ,  Adam Bailey ,  R. Scott Semken ,  Kai Xin ,  John H. Burdett, Jr.

IPC分类号： G21K1/06 ,  G01N23/223 ,  G01N23/20 ,  H05G1/04

CPC分类号： G21K1/06 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/315 ,  G01N2223/423 ,  G21K2201/062 ,  G21K2201/064 ,  H05G1/04

摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

公开(公告)号：US09048001B2

公开(公告)日：2015-06-02

申请号：US14052078

申请日：2013-10-11

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  David M. Gibson ,  Walter M. Gibson ,  Adam Bailey ,  R. Scott Semken ,  Kai Xin ,  John H. Burdett, Jr.

IPC分类号： G21K1/06 ,  G01N23/223 ,  G01N23/20

CPC分类号： G21K1/06 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/315 ,  G01N2223/423 ,  G21K2201/062 ,  G21K2201/064 ,  H05G1/04

摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

摘要翻译： 一种用X射线束照射样品斑点的X射线分析装置。 提供具有源极点的X射线管，从该源点产生具有特征的第一能量和bre致辐射能量的发散X射线束; 第一x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时对光束进行单色; 并且第二x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时将光束单色化为第二能量。 第一个X射线光学元件可以对来自源光斑的特征能量进行单色化，第二个X射线光学元件可以从源光点单色bre致辐射能量。 x射线光学元件可以是弯曲的衍射光学器件，用于从X射线管接收发散的X射线束并将光束聚焦在样品点处。 还提供检测以检测和测量例如包括玩具和电子产品在内的制造产品中的各种毒素。