Invention Grant
- Patent Title: Device, system and method for providing on-chip test/debug functionality
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Application No.: US15394666Application Date: 2016-12-29
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Publication No.: US10705142B2Publication Date: 2020-07-07
- Inventor: Lakshminarayana Pappu , Suketu U. Bhatt , Satheesh Chellappan
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Womble Bond Dickinson (US) LLP
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/317 ; G06F11/00

Abstract:
Techniques and mechanisms for providing on-chip link control functionality to facilitate emulation of a communication. In an embodiment, an integrated circuit (IC) chip includes a physical layer (PHY) which supports communication compatible with a high-speed serial interface standard. A link controller of the IC chip is coupled between the PHY and an interconnect architecture which variously couples a host and other resources of the IC chip to each other. A test controller of the IC chip signals a test mode to implement a loopback path of the link controller in lieu of one or more functional paths for communication with the PHY. In another embodiment, signal output by the loopback path emulate a communication from a resource other than the test controller.
Public/Granted literature
- US20180188321A1 DEVICE, SYSTEM AND METHOD FOR PROVIDING ON-CHIP TEST/DEBUG FUNCTIONALITY Public/Granted day:2018-07-05
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