A source side programming method and system are provided. A bad trigger block, of a plurality of blocks of a memory array, may be detected by determining a threshold voltage distribution of a drain side select gate of a block and determining whether the distribution is abnormal. If the distribution is abnormal, the block is a bad trigger block which may cause a failure in another block. IF the block is a bad trigger block, source side programming is performed on at least one word line of the bad trigger block by applying a non-zero voltage to at least one source side word line of the bad trigger block via a source side line.