Invention Grant
- Patent Title: Avalanche photodiode
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Application No.: US16345613Application Date: 2017-09-26
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Publication No.: US10707369B2Publication Date: 2020-07-07
- Inventor: Kazuhiro Natsuaki , Takahiro Takimoto , Masayo Uchida
- Applicant: SHARP KABUSHIKI KAISHA
- Applicant Address: JP Sakai, Osaka
- Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee Address: JP Sakai, Osaka
- Agency: ScienBiziP, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6ab5c13a
- International Application: PCT/JP2017/034789 WO 20170926
- International Announcement: WO2018/088047 WO 20180517
- Main IPC: H01L31/107
- IPC: H01L31/107 ; H01L29/06 ; H01L31/02 ; H01L31/0203 ; H01L31/0236

Abstract:
An avalanche photodiode according to the present invention includes, inside a substrate semiconductor layer having a first conductivity type and a uniform impurity concentration, a first semiconductor layer having the first conductivity type, a second semiconductor layer having a second conductivity type, a third semiconductor layer having the second conductivity type, a fourth semiconductor layer having the second conductivity type, a fifth semiconductor layer having the first conductivity type and formed at a position away from the third semiconductor layer in a lateral direction, a sixth semiconductor layer having the second conductivity type, a first contact, and a second contact. The first semiconductor layer is positioned just under the second semiconductor layer and the fifth semiconductor layer in contact therewith. An avalanche phenomenon is caused at a junction between the first semiconductor layer and the second semiconductor layer.
Public/Granted literature
- US20190280145A1 AVALANCHE PHOTODIODE Public/Granted day:2019-09-12
Information query
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