- 专利标题: Failure detection for central electronics complex group management
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申请号: US16184081申请日: 2018-11-08
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公开(公告)号: US10713138B2公开(公告)日: 2020-07-14
- 发明人: Perinkulam I. Ganesh , Ravi Shankar , Esdras Cruz-Aguilar , Jes Kiran Chittigala , Michael Burton , Corradino Jones , Denise Marie Genty , James Pafumi
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Cantor Colburn LLP
- 代理商 David Quinn
- 主分类号: G06F11/20
- IPC分类号: G06F11/20 ; G06F3/06
摘要:
Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first logical partition (LPAR) probe to a hardware management console (HMC) of a central electronics complex (CEC) group, wherein the CEC group comprises a plurality of LPARs. Another aspect includes receiving a first response packet from the HMC corresponding to the first LPAR probe, wherein the first response packet comprises health data corresponding to a first LPAR of the plurality of LPARs. Another aspect includes storing the health data corresponding to the first LPAR in a first health data entry corresponding to the first LPAR. Another aspect includes, for a second LPAR of the plurality of LPARs that was not included in the first response packet, updating a second health data entry corresponding to the second LPAR to indicate that the second LPAR is healthy.
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