- Patent Title: System and method for monitoring qualities of teaching and learning
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Application No.: US16120097Application Date: 2018-08-31
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Publication No.: US10726247B2Publication Date: 2020-07-28
- Inventor: I-Chang Tsai , Chao-Hung Liao , Chung-Han Yeh , Han-Yen Yu , Yu-Te Ku
- Applicant: Institute For Information Industry
- Applicant Address: TW Taipei
- Assignee: Institute For Information Industry
- Current Assignee: Institute For Information Industry
- Current Assignee Address: TW Taipei
- Agency: Skaar Ulbrich Macari, P.A.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@17d7481b
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G10L15/26 ; G06Q50/20 ; G09B5/02

Abstract:
A system and method for monitoring qualities of teaching and learning are provided. The system includes at least one receiving interface, a processor, and an output apparatus, wherein the processor is electrically connected to the at least one receiving interface and the output apparatus. The at least one receiving interface receives at least one digital image. The processor identifies at least one facial message from the at least one digital image, identifies at least one body message from the at least one digital image, and determines at least one teaching and learning quality index according to the at least one facial message and the at least one body message. The output apparatus outputs the at least one facial message, the at least one body message, and the at least one teaching and learning quality index.
Public/Granted literature
- US20200034607A1 SYSTEM AND METHOD FOR MONITORING QUALITIES OF TEACHING AND LEARNING Public/Granted day:2020-01-30
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