发明授权
- 专利标题： Photovoltaic power generation system inspection apparatus and inspection method
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申请号： US15786732申请日： 2017-10-18
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公开(公告)号： US10727357B2公开(公告)日： 2020-07-28
- 发明人: Tsuyoshi Takeuchi , Akihiko Sano , Kohei Tomita
- 申请人： OMRON Corporation
- 申请人地址： JP Kyoto-shi
- 专利权人： OMRON Corporation
- 当前专利权人： OMRON Corporation
- 当前专利权人地址： JP Kyoto-shi
- 代理机构： Metrolex IP Law Group, PLLC
- 优先权： com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6d554936
- 主分类号： G01R31/26
- IPC分类号： G01R31/26 ; G01R31/40 ; H01L31/02 ; H01L31/0443 ; H02S50/10 ; H02S50/00
摘要：
A defect number determination unit determines whether or not a solar cell string is defective in a plurality of positions on the basis of whether or not a combined impedance found from impedances in the case where an inspection signal is applied to a P terminal and an N terminal of the solar cell string deviates from a reference impedance by greater than or equal to a predetermined threshold.
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