Invention Grant
- Patent Title: Structure and system for simultaneous sensing a magnetic field and mechanical stress
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Application No.: US15807741Application Date: 2017-11-09
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Publication No.: US10746817B2Publication Date: 2020-08-18
- Inventor: Steven Kosier , Gregory Delmain
- Applicant: Allegro MicroSystems, LLC
- Applicant Address: US NH Manchester
- Assignee: Allegro MicroSystems, LLC
- Current Assignee: Allegro MicroSystems, LLC
- Current Assignee Address: US NH Manchester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R33/00 ; G01R33/07

Abstract:
A structure having collocated magnetic field sensing elements can be used to simultaneously determine magnetic field and mechanical stress. A primary magnetic field sensing element generates a primary signal responsive to a magnetic field and a secondary magnetic field sensing element generates a secondary signal responsive to mechanical stress. A system includes a stress compensation module to receive the primary and signals, and to compensate for mechanical stress in the primary signal.
Public/Granted literature
- US20180321329A1 Structure and System for Simultaneous Sensing a Magnetic Field and Mechanical Stress Public/Granted day:2018-11-08
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