Invention Grant
- Patent Title: Method for performing measurement and terminal
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Application No.: US16057061Application Date: 2018-08-07
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Publication No.: US10750386B2Publication Date: 2020-08-18
- Inventor: Hyangsun You , Yunjung Yi , Kijun Kim , Jonghyun Park
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04W48/16 ; H04L12/911 ; H04L1/06 ; H04L5/00 ; H04W24/10 ; H04B17/318 ; H04L27/26 ; H04W36/00 ; H04W84/04 ; H04W88/02

Abstract:
A method is provided for performing a measurement. The method may be performed by a user equipment (UE) and includes applying both of a measurement subframe pattern for a neighbor cell and a measurement timing configuration for a discovery signal, and selecting at least one or more subframes, to perform the measurement according to the appliance of the measurement subframe pattern and the measurement timing configuration.
Public/Granted literature
- US20180343576A1 METHOD FOR PERFORMING MEASUREMENT AND TERMINAL Public/Granted day:2018-11-29
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