Invention Grant
- Patent Title: Methods and apparatuses for assessing high temperature bonding systems and bonded substrates therefrom
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Application No.: US15344530Application Date: 2016-11-06
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Publication No.: US10755000B2Publication Date: 2020-08-25
- Inventor: Hannes Martin Hinrich Greve , F. Patrick McCluskey , Shailesh N. Joshi
- Applicant: Toyota Motor Engineering & Manufacturing North America, Inc. , University of Maryland, College Park
- Applicant Address: US TX Plano US MD College Park
- Assignee: Toyota Motor Engineering & Manufacturing North America, Inc.,University of Maryland
- Current Assignee: Toyota Motor Engineering & Manufacturing North America, Inc.,University of Maryland
- Current Assignee Address: US TX Plano US MD College Park
- Agency: Dinsmore & Shohl LLP
- Main IPC: G06F30/17
- IPC: G06F30/17 ; B22F3/105 ; G06F30/20 ; B33Y50/00 ; C22C1/04 ; B22F3/11 ; C22C1/08 ; B23K103/12 ; G06F119/08 ; G06F119/18

Abstract:
Methods and apparatuses for assessing the behavior of high temperature bonding systems such as sinter joint models of virtual interconnect microstructures via simulations that analyze sinter joint model properties include defining a plurality of sinter joint objects in a virtual interconnect microstructure, each sinter joint object having a type and a size, and determining a location of individual sinter joint objects with respect to one another in a virtual joint space to create a sinter joint model. The type is at least one of an intermetallic compound, a void, and a metal particle. The location is determined by, for each object, creating three-dimensional coordinates, and based on a determination that the sinter joint object is spaced from and non-overlapping with previously placed sinter joint objects, locking a position and size of the sinter joint object.
Public/Granted literature
- US20170132354A1 Methods And Apparatuses For Assessing High Temperature Bonding Systems And Bonded Substrates Therefrom Public/Granted day:2017-05-11
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