- Patent Title: Circuit board inspection device and circuit board inspection method
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Application No.: US15522790Application Date: 2015-08-07
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Publication No.: US10761654B2Publication Date: 2020-09-01
- Inventor: Tadashi Takahashi , Toshihisa Hibarino , Mutsuhiro Honda
- Applicant: NIDEC-READ CORPORATION
- Applicant Address: JP Kyoto
- Assignee: NIDEC-READ CORPORATION
- Current Assignee: NIDEC-READ CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Viering, Jentschura & Partner MBB
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@34dfdb51
- International Application: PCT/JP2015/072558 WO 20150807
- International Announcement: WO2016/067709 WO 20160506
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044 ; G01R31/28 ; G01R27/26 ; G06F3/045 ; G01R27/02

Abstract:
A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.
Public/Granted literature
- US20170315672A1 CIRCUIT BOARD INSPECTION DEVICE AND CIRCUIT BOARD INSPECTION METHOD Public/Granted day:2017-11-02
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