Invention Grant
- Patent Title: Charged particle beam apparatus and image acquisition method
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Application No.: US16420466Application Date: 2019-05-23
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Publication No.: US10763077B2Publication Date: 2020-09-01
- Inventor: Takeshi Otsuka
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@62070575
- Main IPC: H01J37/28
- IPC: H01J37/28 ; G06T7/90 ; G01N23/2251 ; H01J37/22

Abstract:
A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample; and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units. The image processing unit performs a process of calculating a tilt direction of a sample surface and a tilt angle of the sample surface based on the plurality of the detection signals for an irradiation position of the charged particle beam; and a process of determining a color of a pixel of the scanned image according to the calculated tilt direction and the calculated tilt angle.
Public/Granted literature
- US20190362934A1 Charged Particle Beam Apparatus and Image Acquisition Method Public/Granted day:2019-11-28
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