- Patent Title: Scanning type laser induced spectrum analysis and detection system
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Application No.: US16348041Application Date: 2016-11-24
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Publication No.: US10823679B2Publication Date: 2020-11-03
- Inventor: Tianzhuo Zhao , Fuqiang Lian , Zeqiang Mo , Weiran Lin , Yang Liu , Shuzhen Nie , Hong Xiao , Hongbo Zhang , Zhongwei Fan
- Applicant: Academy of Opto-Electronics Chinese Academy of Sciences
- Applicant Address: CN Beijing
- Assignee: Academy of Opto-Electronics Chinese Academy of Sciences
- Current Assignee: Academy of Opto-Electronics Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6defd92
- International Application: PCT/CN2016/107129 WO 20161124
- International Announcement: WO2018/082136 WO 20180511
- Main IPC: G01N21/71
- IPC: G01N21/71 ; G01N33/24

Abstract:
A scanning type laser induced spectrum surface range analysis and detection system includes a laser emitting head connected to an external laser inducing light source, which generates lasers emitted through the laser emitting head, so as to generate laser induced plasma. A focusing optical device converges induction excited laser beams emitted by the laser emitting head onto a surface of a tested sample. Then, a reflector collects wide spectral range induced plasma scattered light signals of the tested sample and converges the signals into a light collecting device. The light collecting device converges induced plasma scattered light into an optical fiber and transmits the induced plasma scattered light to an external spectrograph; and the external spectrograph divides a spectrum formed by the plasma to obtain spectral strength data of different wavelengths.
Public/Granted literature
- US20190271652A1 SCANNING TYPE LASER INDUCED SPECTRUM ANALYSIS AND DETECTION SYSTEM Public/Granted day:2019-09-05
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