发明授权
- 专利标题: Method and apparatus for performing a polishing process in semiconductor fabrication
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申请号: US13240856申请日: 2011-09-22
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公开(公告)号: US10857649B2公开(公告)日: 2020-12-08
- 发明人: Bo-I Lee , Huang Soon Kang , Chi-Ming Yang , Chin-Hsiang Lin
- 申请人: Bo-I Lee , Huang Soon Kang , Chi-Ming Yang , Chin-Hsiang Lin
- 申请人地址: TW Hsin-Chu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: B24B37/32
- IPC分类号: B24B37/32 ; B24B9/06
摘要:
The present disclosure provides an apparatus for fabricating a semiconductor device. The apparatus includes a polishing head that is operable to perform a polishing process to a wafer. The apparatus includes a retaining ring that is rotatably coupled to the polishing head. The retaining ring is operable to secure the wafer to be polished. The apparatus includes a soft material component located within the retaining ring. The soft material component is softer than silicon. The soft material component is operable to grind a bevel region of the wafer during the polishing process. The apparatus includes a spray nozzle that is rotatably coupled to the polishing head. The spray nozzle is operable to dispense a cleaning solution to the bevel region of the wafer during the polishing process.
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