- 专利标题: X-ray phase contrast imaging apparatus
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申请号: US16309820申请日: 2017-03-15
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公开(公告)号: US10859512B2公开(公告)日: 2020-12-08
- 发明人: Koichi Tanabe , Toshinori Yoshimuta , Kenji Kimura , Hiroyuki Kishihara , Yukihisa Wada , Takuro Izumi , Taro Shirai , Takahiro Doki , Satoshi Sano , Akira Horiba
- 申请人: Shimadzu Corporation
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Muir Patent Law, PLLC
- 优先权: JP2016-118933 20160615
- 国际申请: PCT/JP2017/010511 WO 20170315
- 国际公布: WO2017/217049 WO 20171221
- 主分类号: G01N23/041
- IPC分类号: G01N23/041 ; A61B6/00 ; G01N23/046 ; G01N23/044
摘要:
Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.
公开/授权文献
- US20190175126A1 RADIATION IMAGING APPARATUS 公开/授权日:2019-06-13
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