Integrated semiconductor processing
Abstract:
Generally, examples described herein relate to integrated solutions for forming cladding layers on trimmed layers that were formed as part of a superlattice. In an example, a first material is selectively etched in a first processing chamber of a processing system. The first material is disposed within alternating layers of the first material and a second material in a channel region on a substrate. A portion of the second material is trimmed in the first processing chamber of the processing system. The substrate is transferred from the first processing chamber of the processing system to a second processing chamber of the processing system without exposing the substrate to an ambient environment exterior to the processing system. A cladding layer is epitaxially grown on respective layers of the trimmed second material in the second processing chamber of the processing system.
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