Invention Grant
- Patent Title: Inspection system and method of inspection
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Application No.: US16622030Application Date: 2018-03-17
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Publication No.: US10883944B2Publication Date: 2021-01-05
- Inventor: Shigeki Masumura
- Applicant: MACHINE VISION LIGHTING INC.
- Applicant Address: JP Tokyo
- Assignee: MACHINE VISION LIGHTING INC.
- Current Assignee: MACHINE VISION LIGHTING INC.
- Current Assignee Address: JP Tokyo
- Agency: Dilworth & Barrese, LLP
- Priority: JP2017-233858 20171205
- International Application: PCT/JP2018/010667 WO 20180317
- International Announcement: WO2019/111426 WO 20190613
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/25 ; G01N21/47 ; G01N21/956 ; G01N21/21
Abstract:
Provided is an inspection lighting device with which, even when changes in light that occur at respective feature points on an object to be inspected are small, the amounts of those changes in light can be determined across the entire field-of-view range, and the feature points can be detected under exactly the same conditions.
Public/Granted literature
- US20200158657A1 INSPECTION SYSTEM AND METHOD OF INSPECTION Public/Granted day:2020-05-21
Information query
