Invention Grant
- Patent Title: Systems and methods for impedance calibration of a semiconductor device
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Application No.: US16397797Application Date: 2019-04-29
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Publication No.: US10886918B2Publication Date: 2021-01-05
- Inventor: Jason M. Johnson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: H03K19/00
- IPC: H03K19/00 ; G11C7/10
Abstract:
Systems and methods for performing an efficient ZQ calibration are provided herein. The described techniques use non-linearity compensation circuitry configured to compensate for a non-linear relationship between variation in a plurality of ZQ calibration codes and corresponding resistance variations, by adjusting either: a magnitude of the adjustment to the calibration step, the ZQCODE to an alternative ZQCODE, or both the magnitude of the adjustment to the calibration step and the ZQCODE to the alternative ZQCODE.
Public/Granted literature
- US20200059232A1 SYSTEMS AND METHODS FOR IMPEDANCE CALIBRATION OF A SEMICONDUCTOR DEVICE Public/Granted day:2020-02-20
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