Invention Grant
- Patent Title: Integration of confined phase change memory with threshold switching material
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Application No.: US15408392Application Date: 2017-01-17
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Publication No.: US10892413B2Publication Date: 2021-01-12
- Inventor: Robert L. Bruce , Fabio Carta , Wanki Kim , Chung H. Lam
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ido Tuchman; Erik K. Johnson
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/24

Abstract:
A phase change memory array and method for fabricating the same. The phase change memory array includes a plurality of bottom electrodes, top electrodes, and memory pillars. Each of the memory pillars includes phase change material surrounded by a dielectric casing. The phase change material is positioned between, and in series circuit with, a respective bottom electrode from the bottom electrodes and a respective top electrode from the top electrodes. A continuous layer of selector material is positioned between the memory pillars and the plurality of bottom electrodes. The selector material is configured to conduct electricity only when a voltage across the selector material exceeds a voltage threshold.
Public/Granted literature
- US20180205017A1 INTEGRATION OF CONFINED PHASE CHANGE MEMORY WITH THRESHOLD SWITCHING MATERIAL Public/Granted day:2018-07-19
Information query
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