Invention Grant
- Patent Title: Mold test apparatus and method
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Application No.: US16049099Application Date: 2018-07-30
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Publication No.: US10900883B2Publication Date: 2021-01-26
- Inventor: Jung Lae Jung , Tea Geon Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2018-0020643 20180221
- Main IPC: G01N15/08
- IPC: G01N15/08 ; B29C33/70 ; H01L21/56

Abstract:
A mold test apparatus includes a mold support plate having a top surface on which a mold is mounted, wherein the mold support plate includes a plurality of test suction pipes communicating with paths in the mold, vacuum pipes each having one end connected to one of the plurality of test suction pipes, a pump connected to the other end of the pipe, and at least one pressure sensor configured to measure a pressure of the vacuum pipe, wherein the paths communicate with adsorption holes provided in a top surface of the mold, and wherein the at least one pressure sensor includes a determining unit configured to determine whether the adsorption holes are clogged by using the measured pressure.
Public/Granted literature
- US20190257734A1 MOLD TEST APPARATUS AND METHOD Public/Granted day:2019-08-22
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