- 专利标题: Coaxial mask alignment device, photolithography apparatus and alignment method
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申请号: US16090015申请日: 2017-03-31
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公开(公告)号: US10901331B2公开(公告)日: 2021-01-26
- 发明人: Chengshuang Zhang
- 申请人: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- 申请人地址: CN Shanghai
- 专利权人: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- 当前专利权人: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- 当前专利权人地址: CN Shanghai
- 代理机构: Muncy, Geissler, Olds & Lowe, P.C.
- 优先权: CN201610200702 20160331
- 国际申请: PCT/CN2017/078939 WO 20170331
- 国际公布: WO2017/167260 WO 20171005
- 主分类号: G03F9/00
- IPC分类号: G03F9/00 ; G03F7/20
摘要:
A coaxial reticle alignment device, a lithography apparatus and alignment methods are disclosed. The coaxial reticle alignment device includes: illumination modules (A, B), each configured to provide an alignment light beam; a projection objective (8) under a reticle (5); a reference plate (9) on a workpiece stage (12), configured to carry a reference mark (10); and an image detection and processing module (11) under the reference plate (9). The reference mark (10) is located within a FOV of the image detection and processing module (11), and during movement of the workpiece stage (12), the image detection and processing module (11) receives the alignment light beam having passed sequentially through the reticle alignment mark (6, 7), the projection objective (8) and the reference mark (10), it captures images of the reticle alignment mark (6, 7) and the reference mark (10) which are processed to derive relative positional information between the reticle alignment mark (6, 7) and the reference mark (10) that enables the alignment of the reticle (5) with the workpiece stage (12). The coaxial reticle alignment device adopts dedicated separate illumination means, has a simple structure, allows easy operation and improves alignment efficiency.
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