A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.