- 专利标题: Bonding process with inhibited oxide formation
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申请号: US16702783申请日: 2019-12-04
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公开(公告)号: US10910341B1公开(公告)日: 2021-02-02
- 发明人: Paul M. Hagelin , Charles I. Grosjean
- 申请人: SiTime Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: SiTime Corporation
- 当前专利权人: SiTime Corporation
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L25/00
摘要:
First and second contacts are formed on first and second wafers from disparate first and second conductive materials, at least one of which is subject to surface oxidation when exposed to air. A layer of oxide-inhibiting material is disposed over a bonding surface of the first contact and the first and second wafers are positioned relative to one another such that a bonding surface of the second contact is in physical contact with the layer of oxide-inhibiting material. Thereafter, the first and second contacts and the layer of oxide-inhibiting material are heated to a temperature that renders the first and second contacts and the layer of oxide-inhibiting material to liquid phases such that at least the first and second contacts alloy into a eutectic bond.
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