Invention Grant
- Patent Title: Storage device with test interface
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Application No.: US16514685Application Date: 2019-07-17
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Publication No.: US10930366B2Publication Date: 2021-02-23
- Inventor: Stephen Hanna
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C29/48
- IPC: G11C29/48 ; G06F13/16

Abstract:
An example system comprises: a master bus electrically coupled to a master multiplexer controlled by a test mode signal selecting between a master physical interface (PHY) and a slave bus of a plurality of slave buses, wherein each slave bus is electrically coupled to a respective slave multiplexer controlled by the test mode signal selecting between a respective slave PHY and the master bus; a plurality of memory components, wherein each memory component of the plurality of memory components is electrically coupled to one of: the master bus or a slave bus of the plurality of slave buses; and a memory test interface electrically coupled to the master bus.
Public/Granted literature
- US20210020259A1 STORAGE DEVICE WITH TEST INTERFACE Public/Granted day:2021-01-21
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