Invention Grant
- Patent Title: Test apparatus and test method
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Application No.: US16146701Application Date: 2018-09-28
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Publication No.: US10935599B2Publication Date: 2021-03-02
- Inventor: Nagatani Kenichi
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: CN201711276164.7 20171206
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317 ; G01R31/3177

Abstract:
A time measurement unit measures the time interval between edges to be monitored in a signal under test DUT_Output including serial data output from a device under test (DUT) 400. A comparison judgment unit calculates the number of bits of the serial data included between the edges to be monitored, based on the time interval thus measured. Furthermore, the comparison judgment unit compares the number of bits thus calculated with an expected value thereof.
Public/Granted literature
- US20190170823A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2019-06-06
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