Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
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Application No.: US16411439Application Date: 2019-05-14
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Publication No.: US10943824B2Publication Date: 2021-03-09
- Inventor: Woojin Lee , Hoon Seok Seo , Sanghoon Ahn , Kyu-Hee Han
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Lee IP Law, P.C.
- Priority: KR10-2018-0113152 20180920
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L21/768

Abstract:
A semiconductor device includes a substrate including an active pattern, a first interlayer dielectric layer on the substrate, the first interlayer dielectric layer including a recess on an upper portion thereof, and a lower connection line in the first interlayer dielectric layer, the lower connection line being electrically connected to the active pattern, and the lower connection line including a conductive pattern, the recess of the first interlayer dielectric layer selectively exposing a top surface of the conductive pattern, and a barrier pattern between the conductive pattern and the first interlayer dielectric layer, the first interlayer dielectric layer covering a top surface of the barrier pattern.
Public/Granted literature
- US20200098620A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2020-03-26
Information query
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