Invention Grant
- Patent Title: Spectacle wearing parameter measurement system, measurement program, measurement method thereof, and manufacturing method of spectacle lens
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Application No.: US15547953Application Date: 2016-03-10
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Publication No.: US10955690B2Publication Date: 2021-03-23
- Inventor: Nobuyuki Tadokoro , Naoya Hirono , Masaaki Matsushima
- Applicant: HOYA LENS THAILAND LTD.
- Applicant Address: TH Patumthani
- Assignee: HOYA LENS THAILAND LTD.
- Current Assignee: HOYA LENS THAILAND LTD.
- Current Assignee Address: TH Patumthani
- Agency: Oliff PLC
- Priority: JPJP2015-047759 20150310
- International Application: PCT/JP2016/057608 WO 20160310
- International Announcement: WO2016/143861 WO 20160915
- Main IPC: G02C13/00
- IPC: G02C13/00 ; G01B11/02 ; G02C7/02 ; G01B11/14 ; G06F3/0484

Abstract:
To perform measurement in which a load on a subject is reduced. To provide a spectacle wearing parameter measurement system including: an information processing unit configured to associate a size of an appearance of at least a part of actual spectacles with a size of an appearance of at least a part of each of the spectacles in an imaging result of imaging a subject wearing the actual spectacles as an imaging target, and obtain a spectacle wearing parameter from the imaging result and the related art of the system.
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